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FOCUSPROFESSIONPRAGMATICINNOVATIONTECHNOLOGYCommitted to being the largest supplier of power semiconductor devices in China
1、Product Reliability Testing Project
The whole series of products pass the reliability test of semiconductor power devices according to JEDEC and AEC101 standards
| Test Iteam | Description | Test Condition | Duration | Ref.Standard |
| PC |
Pre-conditioning |
Pre-test & V/M TMCL -> Bake Soak (MSL 1) IR Reflow Post-test & V/M |
Pre &Post- test | JESD22-A113 |
| ACLV(PCT) |
Autoclave(Pressure Cooker Test) |
TA=121°C / 100%RH, Gauge Pressure 15 psig ; Unbiased. |
24/96 Hours | JESD22-A102 |
| HTSL |
High Temperature Storage Life |
TA=150°C, or specified maximum storage temperature. |
168/500/1000 Hours | JESD22-A103 |
| RSH |
Resistance to Solder Heat |
TA=260°C, 10 Sec. (for SMD) TA=270°C, 7 Sec. (for Thr-Hole) |
1 Cycle |
JESD22-A111 JESD22-B106 |
| TMCL(TCH) |
Temperature Cycling |
TA=-65°C to +150°C, dwell time 15min. (30min/cycle), Air to air |
100/500/1000 Cycles | JESD22-A104 |
| H3TRB(THB) |
High Humidity High Temperature Reverse Bias |
TA=85°C, 85%RH, 80% of rated BV ; or up to a maximum of 100V |
168/500/1000 Hours | JESD22-A101 |
| HTRB |
High Temperature Reverse Bias |
TA=150°C or specified max. Tj (T A is to be adjusted to compensate for leakage ) , 80% of rated BV |
168/500/1000 Hours | JESD22-A108 |
| HTGB |
High Temperature Gate Bias (for MOSFET only) |
TA=150°C or specified max. T； (T A is to be adjusted to compensate for leakage), 100% of rated VGS |
168/500/1000 Hours | JESD22-A108 |
| OPL |
Operating Life |
TA=25°C, max. power rating or powered to max. Tj | 168/500/1000 Hours | JESD22-A108 |
| IOL |
Intermittent Operating Life |
TA=25 0 C, ATj 2 100 〇 C, t 0N =t 0FF =2 min (or 3_5 min} | 2520/7500/15000 Cycles |
MIL-STD-750 Method 1037 |
2、Product Reliability Test Report
| Part Number | Reliability Test Report |
|---|---|
| DT8T35I |
|
| DT12T35I |
|
| DT16T35I |
|
| DT4T10F |
|
| DT16T35E |
|